Yoshida, R. K. (1976). Out-of-level testing of special education students with a standardized achievement battery . Journal of Educational Measurement , 13 (3), 215–221. https://doi.org/10.1111/j.1745-3984.1976.tb00012.x
Yoshida, R. K. (1976). Out-of-level testing of special education students with a standardized achievement battery. Journal of Educational Measurement, 13(3), 215–221. https://doi.org/10.1111/j.1745-3984.1976.tb00012.x
Also accessible online at: http://www.jstor.org/stable/1433735
Special education students were assigned to three levels of the Metropolitan Achievement test based on teacher assignment (teachers viewed test booklets and used judgment to assign students to the most appropriate test level). The disparities between the age-grade placement of the students and out-of-level test selected were as great as 10 grades in some cases. Yoshida examined the impact of out-of-level testing on chance level scoring and reliability.
A total of 359 EMR (special education) students participated from across 12 unified school districts in California (U.S.). Mean age was 15 years old. Additional demographics included: 21.4% Caucasian, 35.1% African American, 40.2% Spanish Surname and 3.3% other non-Caucasian.
Primary One, Primary Two, or Elementary level of the Metropolitan Achievement Test (MAT) served as the dependent variable.
The percentage of students exceeding the chance score on a subtest ranged from 82.8% to 99.3%. Reliability estimates (KR-20) ranged from .86 to .946.